Showing results: 31 - 41 of 41 items found.
-
W6602A -
Keysight Technologies
The W6602A LPDDR4 rigid RC BGA interposer for LPDDR4 200-ball DRAM enables capture of simultaneous read and write traffic at data rates and has been tested to 3200 MT/s. Two U4207A zero Ω, 34-channel, soft touch pro, single-ended, 4 x 160-pin direct connect probes are required to connect the W6602A LPDDR4 BGA interposer into two U4164A logic analyzer modules. The W6602A LPDDR4 rigid RC BGA interposer allows signal access to the LPDDR4 signals critical to your debug and validation effort through a U4164A logic analyzer system. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR4 200-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR4 signals.
-
CT4121 -
Cal Test Electronics
The CT4121 is a compact FET probe with very high input resistance and low input capacitance. With a 1.2 GHz bandwidth, this probe is ideal for timing analysis or troubleshooting high speed logic circuits, for design verification of disk drives, as well as for wireless and data communication design. The CT4121 can measure up to ±40 V (DC + AC peak). Compatible with oscilloscopes from all major manufacturers, the probe is powered by the included 9 V battery or direct from the oscilloscope using the included USB power lead.
-
W3636A -
Keysight Technologies
The W3636A DDR4 x16 BGA interposer allows you to gain signal access to the DDR3 signals critical to your debug and validation effort through a logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DDR3 x16 non-stacked DRAM or with an optional 3rd party socket (not provided) enabling operation and acquisition of high-speed DDR3 signals without impacting the performance of your design.
-
MPI Probe Card Technology
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.
-
DtifEasy Series -
Marvin Test Solutions, Inc.
DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports MTS' 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
-
ScopeLogicDAQ -
RK-System
ScopeLogic - complete data acquisition system - consists of Digital Oscilloscope and Logic Analyser. This small instrument is making the accurate analysis of complex analog-digital signals possible - thanks to simultaneous sampling finding relationship between these signals is easy. The user is able to simultaneous use 16 digital channels and 2 analog channels with standard scope probes.
-
W4636A -
Keysight Technologies
The W4636A DDR4 x16 – 2 wing BGA interposer for 96 ball DDR4 DRAM is designed for data rates up to and including 2.4 Gb/s. The W4636A probes all ADD/CMD/CNTRL and partial DQ/DQS, and it is designed for minimal KOV for space limited systems under test. The W4636A is the least expensive DDR4 BGA interposer for a logic analyzer.
-
DS-85 -
Ceibo Inc.
* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
-
BusFinder -
Acute Technology Inc.
*PC-based, 64 channels*USB 3.0 interface, 12V power adaptor*32Gb total memory*Protocol Analyzer:eMMC5.1, NAND Flash, SD3.0, SD 4.0 (UHS-II)*Logic Analyzer:eMMC5.1, NAND Flash, SD3.0, Serial Flash, SPI NAND, SPI*Each protocol has its own probe for easier connection, higher capture quality*Two sets of voltage detects to detects voltage changes
-
BS05 -
BitScope
20 MHz Bandwidth.40 MSps Logic Capture.2 Analog Scope Channels.2 Analog Comparator channels.6 Logic/Protocol Analyzer channels.8 & 12 bit native analog sample resolution.Decodes Serial, SPI, I2C, CAN and more.Windows, Linux, Mac OS X & Raspberry Pi.Built-in analog waveform & clock generators.User programmable, C/C++, Python, VM API.Tiny, light weight (14g) and water resistant.Standard oscilloscope probe adapters available.
-
Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/